Xallent is developing the next generation of Scanning Probe Microscopes (SPM) to enable advanced, rapid, in-line testing of semiconductor devices and thin-films at the micro- and nano-scales. Patented technologies are based on integrating one or multiple tips with supporting sensing, actuation and electronics on a single probe chip. These “probe platforms-on-a-chip” are designed and fabricated using advanced nanoelectromechanical system (NEMS) technologies, enabling simple and cost-effective miniaturization to the nanoscale.
Location: Ithaca, NY
Foundation Cornell Technology Licensed: 2015